Hi there,

I'm running a transient simulation, and I want to get all instances with model implementation hisim_hv because after that I want to process the data and to adjust some parameters for this kind of devices before dumping the values.

What is the easiest/fastest way to get those instances in skill/ocean?

What I did until now: 

- save the final OP of the simulation and then in skill

openResults()
selectResults('tranOp)
report(?type "hisim_hv" ?param "vgs")

Output seems to be promising, and looks like I can redirect it to a file and after that I have to parse the file.

Is there other simple way? I mean to not save data to file and to parse it.

Eventually having an instance name, is it possible to get the model implementation (hsim_hv, bsim4, etc..)? 

Best Regards,

Marcel

It’s now official: Perspec System Verifier is rated the #1 product in the #1 category of Portable Stimulus, according to the 2017 EDA User Survey published on Deepchip.com. There were 33 user responses in favor of Perspec as the #1 tool, and dr...(read more)

It’s always good to hear what real users think of products. Here is a very detailed review (~4000 words) by an Anonymous user, nick named Ant-Man (from the movie). Overall it’s a very strong endorsement of Perspec, and summarize...(read more)

The Cadence® Connections® Verification Program brings together a worldwide network of services, training, and IP development experts that support Cadence verification solutions. The program members help customer accelerate the adoption of new...(read more)

The Accellera Portable Stimulus Working Group met at the DVCon 2018 to move the process forward towards ratification. While we can't predict exactly when it will be ratified, the goal is now more clearly in sight! Cadence booth was busy with a lo...(read more)

CDNLive is a user conference, and verification is one of the largest categories of content with multiple tracks covering multiple days. Portable stimulus is one of the hottest new areas in verification, and continues to be popular in all venues. At l...(read more)

Cadence pulled a fast one at DAC 2018, almost like a bait and switch. We advertised a hands-on workshop to learn about Accellera Portable Stimulus Specification (PSS) v1.0. But we made participants compete head to head, for prizes, and their pride! T...(read more)

Vegas, here we come. All of us fun EDA engineers at once. Be prepared, next week’s Design Automation Conference will be busy! The trends I had outlined after last DAC in 2018—system design, cloud, and machine learning—have...(read more)

If I talk about my life, it was much simpler when I used to live with my parents. They took good care of whatever I wanted - in fact, they still do. But now, I am living alone, and sometimes I buy...

[[ Click on the title to access the full blog on the Cadence Community site. ]]

So, what if you can figure out all that can go wrong when your product is being assembled early on? Not guess but know and correct at an early stage – not wait for the fabricator or manufacturer to send you a long report of what needs to change. That’s why Design for Assembly (DFA) rules(read more)

I noticed some very interesting news last week, widely reported in the technical press, and you can find the source press release here. In a nutshell, the Embedded Microprocessor Benchmark Consortium (EEMBC) has formed a group to look at benchmarks for ultra low power microcontrollers. Initially chaired by Horst Diewald, chief architect of MSP430^TM microcontrollers at Texas Instruments, the group's line-up is an impressive "who's who" of the microcontroller space, including Analog Devices, ARM, Atmel, Cypress, Energy Micro, Freescale, Fujitsu, Microchip, Renesas, Silicon Labs, STMicro, and TI.

As the press release explains, unlike usual processor benchmark suites which focus on performance, the ULP benchmark will focus on measuring the energy consumed by microcontrollers running various computational workloads over an extended time period. The benchmarking methodology will allow the microcontrollers to enter into their idle or sleep modes during the majority of time when they are not executing code, thereby simulating a real-world environment where products must support battery life measured in months, years, and even decades.

Processor performance benchmarks seem to be as widely criticized as EPA fuel consumption figures for cars - and the criticism is somewhat related. There is a suspicion that manufacturers can tune the performance for better test results, rather than better real-world performance. On the face of it, the task to produce meaningful ultra low power benchmarks seems even more fraught with difficulties. For a start, there is a vast range of possible energy profiles - different ways that computing is spread over time - and a plethora of low power design techniques available to optimize the system for the set of profiles that particular embedded system is likely to experience. Furthermore, you could argue that, compared with performance in a computer system, energy consumption in an ultra low power embedded system has less to do with the controller itself and more to do with other parts of the system like the memories and mixed-signal real-world interfaces.

EEMBC cites that common methods to gauge energy efficiency are lacking in growth applications such as portable medical devices, security systems, building automation, smart metering, and also applications using energy harvesting devices. At Cadence, we are seeing huge growth in these areas which, along with intelligence being introduced into all kinds of previously "dumb" appliances, is becoming known as the "Internet of Things." Despite the difficulties, with which the parties involved are all deeply familiar, I applaud this initiative. While it may be difficult to get to apples-to-apples comparisons for energy consumption in these applications, most of the time today we don't even know where the grocery store is. If the EEMBC effort at least gets us to the produce department, we're going to be better off.

Pete Hardee 

There is no better way other than a self-help training kit -- (rapid adoption kit, or RAK) -- to demonstrate the Incisive Enterprise Simulator's IEEE 1801 / UPF low-power features and its usage. The features include:

• Unique SimVision debugging 
• Patent-pending power supply network visualization and debugging
• Tcl extensions for LP debugging
• Support for Liberty file power description
• Standby mode support
• Support for Verilog, VHDL, and mixed language
• Automatic understanding of complex feedthroughs
• Replay of initial blocks
• ‘x' corruption for integers and enumerated types
• Automatic understanding of loop variables
• Automatic support for analog interconnections

Mickey Rodriguez, AVS Staff Solutions Engineer has developed a low power UPF-based RAK, which is now available on Cadence Online Support for you to download.

• This rapid adoption kit illustrates Incisive Enterprise Simulator (IES) support for the IEEE 1801 power intent standard. 

Patent-Pending Power Supply Network Browser. (Only available with the LP option to IES)

• In addition to an overview of IES features, SimVision and Tcl debug features, a lab is provided to give the user an opportunity to try these out.

The complete RAK and associated overview presentation can be downloaded from our SoC and Functional Verification RAK page:

We are covering the following technologies through our RAKs at this moment:

Synthesis, Test and Verification flow
Encounter Digital Implementation (EDI) System and Sign-off Flow
Virtuoso Custom IC and Sign-off Flow
Silicon-Package-Board Design
Verification IP
SOC and IP level Functional Verification
System level verification and validation with Palladium XP

Please visit https://support.cadence.com/raks to download your copy of RAK.

We will continue to provide self-help content on Cadence Online Support, your 24/7 partner for learning more about Cadence tools, technologies, and methodologies as well as getting help in resolving issues related to Cadence software. If you are signed up for e-mail notifications, you're likely to notice new solutions, application notes (technical papers), videos, manuals, etc.

Note: To access the above documents, click a link and use your Cadence credentials to log on to the Cadence Online Support https://support.cadence.com/ website.

Happy Learning!

Sumeet Aggarwal and Adam Sherer

ST Microelectronics reported their success with IEEE 1801 / UPF low-power simulation using Incisive Enterprise Simulator at CDNLive India in November 2013. We were able to meet with Mohit Jain just after his presentation and recorded this video that explains the key points in his paper.

With eight years of experience and pioneering technology in native low-power simulation, Mohit was able to apply Incisive Enterprise Simulator to a low-power demonstrator in preparation for use with a production set-top box chip.  Mohit was impressed with the ease in which he was able to reuse his existing IEEE 1801 / UPF code successfully, including the power format files and the macro models coded in his Liberty files. Mohit also discusses how he used the power-aware Cadence SimVision debugger.

The Cadence low-power verification solution for IEEE 1801 / UPF also incorporates the patent-pending Power Supply Network visualization in the SimVision debugger.  You can learn more about that in the Incisive low-power verification Rapid Adoption Kit for IEEE 1801 / UPF here in Cadence Online Support.

Just another happy Cadence low-power verification user!

Regards,

 Adam "The Jouler" Sherer 

Hello

The document I referenced is https://filebox.ece.vt.edu/~symort/rfworkshop/Mixer_workshop_instruction.pdf. (This is cadence workshop document)

While following the pxf simulation in the above article, the results are different and I have a question.

My result picture is shown below.

<my result error>

<document result>

<my direct plot>

<document direct plot>

The difference with the documentation is that in the direct plot screen after the pxf simulation,

1.output harmonics-> input sideband

2.Frequency axis: out-> frequency axis: absin

3.The results for port0 (RF port) are also different (see photo below).

4.The frequency values in the box are different.

My screen shows 5G, 10G, 1K ~ 10M, but the document is the same as 1K ~ 10M.

Ask for a solution. Thank you.

Hi, all

Recently, I meet the simulation error as the picture shows when I simulate my circuit with transient.  how can I solve this problem?

thank you~

Hi All,

I saw the cadence tutorial on measuring IIP3 with 3 tones test (Lets say I have a mixer in the test so two tones are entered in the RF port and one is the LO).

Now, I would like to verify if my receiver meets the bluetooth standard. In the standard it says to enter a signal at -64dBm and two additional signals (interference) 

at -39dBm each which placed one k (lets say k equals to one for the example) channels apart and the other 2k channels apart (so 3 signals enter the RF port). These signals cause an intermodulation product to fall

at the frequency of the desired signal. I would like to measure the IIP3 in this case. 

Now, I need to enter 4 tones and the IIP3 is measured (based on cadence tutorial) using sweep in the hb.

I do not want to sweep power since I need to enter exact power. I tried to use multi sinusoidal option in the port with exact power but it does not work.

How in general am I be able to check communication standard in this way using virtuoso and measure IIP3?

Can someone please help me?

Thanks in advance! 

Hi, when I applied a voltage divider implemented by two 100-ohm resistors to a 2Vpp 5GHz vsin source, the phase noise simulation using pnoise/fullspectrum with different types, jitter and source have different results. The simulated output noise results are 165.76aV2/Hz for pmjitter case, and 828.79zV2/Hz for source case. The source case result equals to the output noise calculation.

For my application, the output will be applied to driven circuits and thus pm jitter is concerned. As the pmjitter is based on the noise sampling at the threshold crossings, I was wondering how spectre gets the pmjitter resullts since sampling white noise with infinite bandwidth is impossible to my knowledge?

Interestingly, the Jee result by integration from 10kHz to 2.5GHz is ~41fs and is closed to Jee,rms from the transient noise simulation. I am also not sure how these results come and match each other. If applying the voltage divider output to drive next stages, I was wondering to what extent I can trust the input jitter from these simulations? Thank you.

Hi,

i'm using spectre HB simulation on PA (Power Amplifier) test_bench to perform large signal analysis (i want to plot Output power vs intput power, PAE and Gain)

Although the simulation returns no error, i still can't plot anything. seem like there is an issue with the ports i'm using. (analoglib ports)

i attach an image of my configuration so maybe you can find something helpful in it. 

thank you all for your help

best regards

hi everyone, 

i'm trying to create a netlist for aging simulation. i would like to simulate how power, Gain and PAE (efficiency) are inlfuenced after 3 hours

i would be grateful if someone can correct my syntax in the netlist since i'm trying to make a sweep HB  simulation where the input power is the parameter.

i did it without any error for the sp (S parameters)  simulation.

you can see the images for both sp and hb simulation netlists. (from left to right: sp aging netlist; hb aging netlist)

i will be grateful if someone can provide me some syntax advices.

thanks,

best regards

Other tools allow a sanity check of placement density vs available board space.  There is an older post "Skill code to evaluate all components area (Accumulative Place bound area)"  (9 years ago) that has a couple of examples that no longer work or expired.

This would be useful to provide feedback to schismatic and project managers regarding the component density on the PCB and how it will affect the routing abilities.  Thermal considerations can be evaluated as well 

Has anyone attempted this or still being done externally in spread sheets?

Hello, i am a student who is studying Allegro tool with SKILL.

I have a question about SKILL axlSegDelayAndZ0. The reference says this function "returns the delay and impedance of a cline segment."

I want to know how many components does this tool consider when calculating timing delay from the length. 

How steep is input signal's rise transition? Is rise transition shape isosceles trapezoid or differential increasing shape?

Also, if it is a multi fan-out, the rise transition time will be different net by net. How can this tool can calculate in this case?

I want to hear answers about these questions.

Thank you for reading this long boring questions, and i will be waiting for answers.

Hello All,

May I know if there is a way to breakup a selected clinesegment into a few clinesegments by just using SKILL code

Thanks All

This is the 21st installment of The Rationalist, my column for the Times of India.

When all political parties agree on something, you know you might have a problem. Giriraj Singh, a minister in Narendra Modi’s new cabinet, tweeted this week that our population control law should become a “movement.” This is something that would find bipartisan support – we are taught from school onwards that India’s population is a big problem, and we need to control it.

This is wrong. Contrary to popular belief, our population is not a problem. It is our greatest strength.

The notion that we should worry about a growing population is an intuitive one. The world has limited resources. People keep increasing. Something’s gotta give.

Robert Malthus made just this point in his 1798 book, An Essay on the Principle of Population. He was worried that our population would grow exponentially while resources would grow arithmetically. As more people entered the workforce, wages would fall and goods would become scarce. Calamity was inevitable.

Malthus’s rationale was so influential that this mode of thinking was soon called ‘Malthusian.’ (It is a pejorative today.) A 20th-century follower of his, Harrison Brown, came up with one of my favourite images on this subject, arguing that a growing population would lead to the earth being “covered completely and to a considerable depth with a writhing mass of human beings, much as a dead cow is covered with a pulsating mass of maggots.”

Another Malthusian, Paul Ehrlich, published a book called The Population Bomb in 1968, which began with the stirring lines, “The battle to feed all of humanity is over. In the 1970s hundreds of millions of people will starve to death in spite of any crash programs embarked upon now.” Ehrlich was, as you’d guess, a big supporter of India’s coercive family planning programs. ““I don’t see,” he wrote, “how India could possibly feed two hundred million more people by 1980.”

None of these fears have come true. A 2007 study by Nicholas Eberstadt called ‘Too Many People?’ found no correlation between population density and poverty. The greater the density of people, the more you’d expect them to fight for resources – and yet, Monaco, which has 40 times the population density of Bangladesh, is doing well for itself. So is Bahrain, which has three times the population density of India.

Not only does population not cause poverty, it makes us more prosperous. The economist Julian Simon pointed out in a 1981 book that through history, whenever there has been a spurt in population, it has coincided with a spurt in productivity. Such as, for example, between Malthus’s time and now. There were around a billion people on earth in 1798, and there are around 7.7 billion today. As you read these words, consider that you are better off than the richest person on the planet then.

Why is this? The answer lies in the title of Simon’s book: The Ultimate Resource. When we speak of resources, we forget that human beings are the finest resource of all. There is no limit to our ingenuity. And we interact with each other in positive-sum ways – every voluntary interactions leaves both people better off, and the amount of value in the world goes up. This is why we want to be part of economic networks that are as large, and as dense, as possible. This is why most people migrate to cities rather than away from them – and why cities are so much richer than towns or villages.

If Malthusians were right, essential commodities like wheat, maize and rice would become relatively scarcer over time, and thus more expensive – but they have actually become much cheaper in real terms. This is thanks to the productivity and creativity of humans, who, in Eberstadt’s words, are “in practice always renewable and in theory entirely inexhaustible.”

The error made by Malthus, Brown and Ehrlich is the same error that our politicians make today, and not just in the context of population: zero-sum thinking. If our population grows and resources stays the same, of course there will be scarcity. But this is never the case. All we need to do to learn this lesson is look at our cities!

This mistaken thinking has had savage humanitarian consequences in India. Think of the unborn millions over the decades because of our brutal family planning policies. How many Tendulkars, Rahmans and Satyajit Rays have we lost? Think of the immoral coercion still carried out on poor people across the country. And finally, think of the condescension of our politicians, asserting that people are India’s problem – but always other people, never themselves.

This arrogance is India’s greatest problem, not our people.

The India Uncut Blog © 2010 Amit Varma. All rights reserved.
Follow me on Twitter.

Hi supporters,

I got the following error while I run simulation with gate netlist using Cadence Incisive (v15.20):

----

ncsim(64): 15.20-s076: (c) Copyright 1995-2019 Cadence Design Systems, Inc.
ncsim: *E,DLOALB: Design library 'tcbnxxx' not defined while reading module tcbnxxx.MAOxxx:bv (VST).
ncsim: *F,NOSIMU: Errors initializing simulation 'alu_tb' 

----

xxx: standard library name.

My netlist design uses a cell "MAOxxx". I already included the library behavior model to compile using ncverilog, there is no error while compiling. But when I run with ncsim to execute the test, I got above error.

I tried to run with other vendors such as VCS or MTI, they worked.

Please help to understand the error.

Thanks.

I'm sending encrypted HDL to a customer who will use Cadence IES for simulation and was wondering how I should go about the encryption.

Does IES support the IEEE's P1735 and if so, where can I find Cadence's public key for performing the encryption?

Or is there an alternative solution that I can use for encryption?

xmsim is not exiting the simulation for this error. It is unusual for the simulator to not exit for an error. I have just started using uvm and this is occurring during the randomization step for a sequencer item.

xmsim: *E,RNDCNSTE

I am using -EXIT on the command line.

I am using Xcelium 19.03-s013.

Any insights are appreciated. Thanks.

-Jim

Hello folks,

Greetings.

One of my customer claims that he is using Cadence IES version 18.09.011 with Vivado 2019.2. The version of IES that we officially support with Vivado 2019.2 is 15.20.073. Though the tool is forward compatible, I am not sure what are the versions of IES that are released after 15.20.073. Could you please give me a list of the versions of Cadence IES released after 15.20.073 and which is the latest version as of now ?

Best regards,

Chinmay

Specman *search* command allows searching in all loaded modules, but only for a string.

Is there a way to search for a regexp or glob?

Alternatively, is there a way to simply get a list of all loaded files somehow? Then I could use either the "shell" command, or real shell together with grep.

Thanks

hi,

due to technical problem i am running simulation through terminal. Therefore, I have a Verilog file, a test bench and i have also exported from Genus synthesized netlist and sdf file. Now, how can i annotate sdf in my post-synthesis simulation using XCELIUM while using command line?

thank you

Hi,

I'm doing fault injection with ncsim and got stuck at the following (and not so useful) message: "ncsim: *E,FLTIGF: [FLT] Failed to inject fault at circuit_tb.U0.n2174." I already tried with other NETs, with SET, SA0, SA1, always the same error occurs.

My scripts so far, considering I already compiled the Verilog testbench and also the gates from the technology library (gate-level simulation):

#this runs ok

ncelab -work worklib -cdslib circuit/trunk/backend/synthesis/work/cds.lib -logfile ncelab.log -errormax 15 -access +wc -status -timescale 1ps/1ps worklib.circuit_tb -fault_file circuit/trunk/backend/synthesis/scripts/fi.list

#this runs ok
ncsim -fault_good_run -fault_tw 1ns:4ns -fault_work fault_db -fault_overwrite worklib.circuit_tb:module -input ../scripts/fs_strobe.tcl -exit

#this runs NOT OK
ncsim -fault_sim_run -fault_work fault_db worklib.circuit_tb:module -input ../scripts/injection.tcl -exit

After the above command I get: "ncsim: *E,FLTIGF: [FLT] Failed to inject fault at circuit_tb.U0.n2174."

Here are the files called from the commands above.

fi.list:

fault_target circuit_tb.U0.n2174 -type SET+SA1+SA0

fs_strobe.tcl:

fs_strobe circuit_tb.WRITE_OUT circuit_tb.PC_OUT[0]

injection.tcl:

fault -stop_severity 3 -inject -time 2ns -type sa1 circuit_tb.U0.n2174

I already checked the NETs with simvision, so their paths are correct.

Any ideas?

PS: I know about Xcellium, however, I don't have it yet.

Variants seem to be defined as present or not present.

Is there a variant that can assign different parts to the same reference designator? i.e.  R17 can be either 0 ohm 0805 jumper or 12k ohms 0805 resistor.

The simplest way I can think of is to use two parts with the same footprint and overlay them.

Is there a more functional way of doing this?  So that the variant would put the correct part in the BOM and the parts would of course have the same identical footprint.

Hello All,

I have a situation where i want to implement 8 instance of some particular reg_file which all have many reg_def and reg_fld.

For example :
I have 8 instance of one DUT module (TEST0, TEST1,TEST2... TEST8), since its all are the instance so all the instance will have the sets of registers.. so to implement reg for one instance i can write code like..

extend vr_ad_reg_file_kind : [TEST0];
extend TEST0 vr_ad_reg_file {
keep size == 256;
};
reg_def EX_REG_TX_DATA TEST0 8’h00 {
// name : type : mask : reset value
reg_fld data : uint(bits:8) : RW : 0;
};

But now the issue is inside 1 instance i have around 256 registers, and i need to implement for all the 8 instance.... so can anyone suggest me how we can make instance for vr_ad_reg_file, otherwise i have to write same code for all the 8 instance.

Thanks

Just in time for the holidays, inside the posted tar ball is some code to solve 9x9 Sudoku puzzles with the Assertion-Driven Simulation (ADS) capability of Incisive Enterprise Verifier (IEV). Enjoy! Joerg Mueller Solutions Engineer for Team Verify

Hello,

 I am working in a digital design. The functional, post synthesis and post P&R without IO pads are all working fine, i.e., functionally and with clean timing reports "no setup/hold violations". I just added the IO pads to the same design, I had to change the timing constraints a bit for the synthesis but I have a clean design at SOC Encounter, i.e., clean DRC and clean timing reports "no setup/hold violations". However, when I perform simulation using the exported net-list from SOC Encounter together with SDF exported from the same tool, I got a lot of hold violations. Consequently, the design is not funcitioning.

Why and how I can overcome or trobleshoot this issue?

In waiting for your feedback and comments.

Regards.

Hi all,

I am using ADE assembler.

I ran transient simulation and swept the input frequency (Fin) of the circuit. And I use Spectrum Measurement to return a value of the fundamental tone magnitude (Sig_fund) for each sweep point. 

Previously, I use "plot across design points" to plot both "Fin" and "Sig_fund", and then use "Y vs Y" to get a waveform of Sig_fund vs Fin. Measure the 1dB Bandwidth with markers. 

Can I realized above measurement with an expression in "output setup" ? And how?

I know to set the "Eval type" to "sweep" to process the data across sweep points. But here, it has to return an interpolated value from "Fin" with a criteria "(value(calcVal("Sig_fund"  0) - 1)". I am not sure whether it can be done in ADE assembler.

Thanks and regards,

Yutao

Hi ,

     I have designed analog IP in cadence ADE and simulated in spectre. All corner results looks good. when i run monte carlo 1000 runs have high current in 125C two runs. Simulated with same setup in different user, all clean.Need to know what type sampling method used and why its not clean with my setup.

Thanks,

Anbarasu

Hello,

I am running a transient simulation on my circuit and usually my simulation time took me more than a day (The circuit is quite big). I am usually saving specific nodes to decrease the simulation time. My problem is, since it usually took me one day to finish I need to save my trans simulation just in case something bad happens. I am aware that the transient simulation have the options for save/restore. But, when I tried to use it I have some problem. Whenever I restore the save file, it starts where it ends before (expected function) but my data is incomplete. It doesn't save the previous data. Its kind of my data is incomplete. What I did is set the saveperiod and savefile. I hope someone can help me. Thank you!

Regards,

Kiel

Hello,

I am trying to use calcVal for creating a spec condition from a simulated parameter and although this works perfectly fine in corner simulations, I am having some difficulties in Monte-Carlo (and I will explain).

(I have also read "Using calcVal() and its arguments with ADE Assembler" in Resources > Rapid Adoption Kits but couldn't find any relevant information that would help me address the "issue").

In the above example I am performing a MC simulation which has 2 corners of 10 runs each. I would like to get the minimum value of variable "OC_limit_thres" out of those 10 runs and pass it as my upper limit to a range argument for variable "OC_flag_thres", so the CPK can be calculated.

So the range statement should in reality be like this:

range 32m 44.34m (for corner 0)

range 32m 43.14m (for corner 1)

If I open the Detail - Transpose view in the Results tab, the calcVal("OC_limit_thres" "Currlim_TurnOn_C11") is calculated perfectly fine for each run but here I need one single value out of those 10 runs - in this case the minimum - in order for calcVal to evalute on multiple runs of 1 corner.

How can this be done please?

Thank you in advance for your time.

Hello,

I would like to simulate the PSSR+/PSSR- and the CMMR using xf for the attached test bench.

Normally, I do the AC analysis and using the post-processing capability of cadence spectre I do 20log(vdd/vout) for PSSR+

and 20*log(vss/vout) for PSSR-. 

looked online from an old post that I do:

PSRR-
db20(1/DATA("/Vn/PLUS" "xf-xf"))

PSRR+
db20(1/DATA("/Vp/MINUS" "xf-xf"))

How about the for the CMRR?

Thanks a lot in advance.  

I have a question regarding simulating IBIS model using Spectre.  IBIS model generation always has the die capacitance included and in the generated IBIS file you will have this value as  “C_comp” value.  Does the Spectre accounts for this capacitance from the IBIS file while computing the time domain voltage waveform during simulation ?  If I add additional capacitance outside in the testbench, to model the die capacitance, then it will be double counting.

Does anyone know if Spectre is already accounting this C_comp during the time domain voltage wave computation from IBIS file, during simulation ?

Hello,

I am using ultrasim Version 18.1.0.314.isr5  64bit 03/26/2019 06:33 (csvcm20c-2).

When I run my netlist, ultrasim is blocked in the first DC stage and takes forever. Then it will fail or never progress. I am using a 22nm BSIMBULK model. I tried to tune different accuracy and convergence aids options but noting works.

 When I run the same netlist with spectre it works fine with no problem.

Also, If I use another model (not BULKSIM), ultrasim will work and converge with no problem.

My first feeling is that ultrasim has a problem with using BSIMBULK model.

Could you please advice,

Thank you,

Kotb

I put some stimulus in the simulation file section : 

_vpd_data_enb (pu_data_enb 0) vsource wave=[0 0 1n 0 1.015n vcchbm 3n vcchbm] dc=0 type=pwl
_vpu_data_enb (pd_data_enb 0) vsource dc=pu_enb type=dc

I get the following error. 

ERROR (OSSGLD-18): The command character after '[' in the NLP expression '[0 0 1n 0 1.015n vcchbm 3n vcchbm] dc=0 type=pwl

' is not a valid

character. The command character is the first character after '[' in the NLP

expression. It must be '?', '!', '#', '$', 'n', '@', '.', '~' or '+'. Enter a

valid character as the command character.

si: simin did not complete successfully.

I dont see anything wrong with the stimulus syntax

Joules RTL Power Solution provides a cockpit for RTL designers to explore and optimize the power efficiency of their designs. But this capability is now not just limited to RTL designers!! Yes, you as a synthesis designer too can use the power analysis capabilities of Joules from within Genus Synthesis Solution!!

But:

• How to do it?
• Is there any specific switch required?
• What is the flow/script when Joules is used from within Genus?
• Are all the Joules commands supported?

To answer to all these questions is just a click away in the form of video on “Genus-Joules Integration”; refer it on https://support.cadence.com (Cadence login required).

Video Title: Genus-Joules Integration (Video)

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Enhance the Genus Synthesis experience with videos: Genus Synthesis Solution: Video Library

Enhance the Joules experience with videos: Joules RTL Power Solution: Video Library

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Several tools can generate power reports based on libraries & stimulus. The issue is what's NEXT?

• Is there any scope to improve power consumption of my design?
• What is the best-case power?
• Pin-point hot spots in my design?
• How to recover wasted power?

And here is the solution in form of Joules RTL Power Exploration. Joules’ framework for power exploration and power implementation/recovery is stimulus based, where analysis is done by Joules and is explored/implemented by user.

Power Exploration capabilities include:

• Efficiency metrics
• Pin point RTL location
• Cross probe to stim
• Centralize all power data

 Do you want to explore more? What is the flow? What commands can be used?

There is a ONE-STOP solution to all these queries in the form of videos on Joules Power Exploration features on https://support.cadence.com (Cadence login required).

Video Links:

How to Analyze Ideal Power Using Joules RTL Power Solution GUI? (Video)

What is Ideal Power Analysis Flow in Joules RTL Power Solution? (Video)

How to Apply Observability Don’t Care (ODC) Technique in Joules? (Video)

How to Debug Wasted Power Using Ideal Power Analyzer Window in Joules GUI? (Video)

Related Resources

Enhance the Joules experience with videos: Joules RTL Power Solution: Video Library

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Key Findings: Advantest, in mixed-signal SoC design, sees 50X speedup, 25 day test reduced to 12 hours, dramatic test coverage increase.

Trolling through the CDNLive archives, I discovered another gem. At the May 2013 CDNLive in Munich, Thomas Henkel and Henriette Ossoinig of Advantest presented a paper titled “Timing-accurate emulation of a mixed-signal SoC using Palladium XP”. Advantest makes advanced electronics test equipment. Among the semiconductor designs they create for these products is a test processor chip with over 100 million logic transistors, but also with lots of analog functions.They set out to find a way to speed up their full-chip simulations to a point where they could run the system software. To do that, they needed about a 50X speed-up. Well, they did it!

Figure 1: Advantest SoC Test Products

To skip the commentary, read Advantest's paper here. 

Problem Statement

Software is becoming a bigger part of just about every hardware product in every market today, and that includes the semiconductor test market. To achieve high product quality in the shortest amount of time, the hardware and software components need to be verified together as early in the design cycle as possible. However, the throughput of a typical software RTL simulation is not sufficient to run significant amounts of software on a design with hundreds of millions of transistors.  

Executing software on RTL models of the hardware means long runs  (“deep cycles”) that are a great fit for an emulator, but the mixed-signal content posed a new type of challenge for the Advantest team.  Emulators are designed to run digital logic. Analog is really outside of the expected use model. The Advantest team examined the pros and cons of various co-simulation and acceleration flows intended for mixed signal and did not feel that they could possibly get the performance they needed to have practical runtimes with software testbenches. They became determined to find a way to apply their Palladium XP platform to the problem.

Armed with the knowledge of the essential relationship between the analog operations and the logic and software operations, the team was able to craft models of the analog blocks using reduction techniques that accurately depicted the essence of the analog function required for hardware-software verification without the expense of a continuous time simulation engine.

The requirements boiled down to the following:

• Generation of digital signals with highly accurate and flexible timing

• Complete chip needs to run on Palladium XP platform

• Create high-resolution timing (100fs) with reasonable emulation performance, i.e. at least 50X faster than simulation on the fastest workstations

Solution Idea

The solution approach chosen was to simplify the functional model of the analog elements of the design down to generation of digital signal edges with high timing accuracy. The solution employed a fixed-frequency central clock that was used as a reference.Timing-critical analog signals used to produce accurately placed digital outputs were encoded into multi-bit representations that modeled the transition and timing behavior. A cell library was created that took the encoded signals and converted them to desired “regular signals”. 

Automation was added to the process by changing the netlisting to widen the analog signals according to user-specified schematic annotations. All of this was done in a fashion that is compatible with debugging in Cadence’s Simvision tool.  Details on all of these facets to follow.

The Timing Description Unit (TDU) Format

The innovative thinking that enabled the use of Palladium XP was the idea of combining a reference clock and quantized signal encoding to create offsets from the reference. The implementation of these ideas was done in a general manner so that different bit widths could easily be used to control the quantization accuracy.

Figure 2: Quantization method using signal encoding

Timed Cell Modeling

You might be thinking – timing and emulation, together..!?  Yes, and here’s a method to do it….

The engineering work in realizing the TDU idea involved the creation of a library of cells that could be used to compose the functions that convert the encoded signal into the “real signals” (timing-accurate digital output signals). Beyond some basic logic cells (e.g., INV, AND, OR, MUX, DFF, TFF, LATCH), some special cells such as window-latch, phase-detect, vernier-delay-line, and clock-generator were created. The converter functions were all composed from these basic cells. This approach ensured an easy path from design into emulation.

The solution was made parameterizable to handle varying needs for accuracy.  Single bit inputs need to be translated into transitions at offset zero or a high or low coding depending on the previous state.  Single bit outputs deliver the final state of the high-resolution output either at time zero, the next falling, or the next rising edge of the grid clock, selectable by parameter. Output transitions can optionally be filtered to conform to a configurable minimum pulse width.

Timed Cell Structure

There are four critical elements to the design of the conversion function blocks (time cells):

                Input conditioning – convert to zero-offset, optional glitch preservation, and multi-cycle path

                Transition sorting – sort transitions according to timing offset and specified precedence

                Function – for each input transition, create appropriate output transition

                Output filtering – Capability to optionally remove multiple transitions, zero-width, pulses, etc.

Timed Cell Caveat

All of the cells are combinational and deliver a result in the same cycle of an input transition. This holds for storage elements as well. For example a DFF will have a feedback to hold its state. Because feedback creates combinational loops, the loops need a designation to be broken (using a brk input conditioning function in this case – more on this later). This creates an additional requirement for flip-flop clock signals to be restricted to two edges per reference clock cycle.

Note that without minimum width filtering, the number of output transitions of logic gates is the sum of all input transitions (potentially lots of switching activity). Also note that the delay cell has the effect of doubling the number of output transitions per input transition.

Figure 3: Edge doubling will increase switching during execution

SimVision Debug Support

The debug process was set up to revolve around VCD file processing and directed and viewed within the SimVision debug tool. In order to understand what is going on from a functional standpoint, the raw simulation output processes the encoded signals so that they appear as high-precision timing signals in the waveform viewer. The flow is shown in the figure below.

Figure 4: Waveform post-processing flow

The result is the flow is a functional debug view that includes association across representations of the design and testbench, including those high-precision timing signals.

Figure 5: Simvision debug window setup

Overview of the Design Under Verification (DUV)

Verification has to prove that analog design works correctly together with the digital part. The critical elements to verify include:

• Programmable delay lines move data edges with sub-ps resolution

• PLL generates clocks with wide range of programmable frequency

• High-speed data stream at output of analog is correct

These goals can be achieved only if parts of the analog design are represented with fine resolution timing.

Figure 6: Mixed-signal design partitioning for verification

How to Get to a Verilog Model of the Analog Design

There was an existing Verilog cell library with basic building blocks that included:

- Gates, flip-flops, muxes, latches

- Behavioral models of programmable delay elements, PLL, loop filter, phase detector

With a traditional simulation approach, a cell-based netlist of the analog schematic is created. This netlist is integrated with the Verilog description of the digital design and can be simulated with a normal workstation. To use Palladium simulation, the (non-synthesizable) portions of the analog design that require fine resolution timing have to be replaced by digital timing representation. This modeling task is completed by using a combination of the existing Verilog cell library and the newly developed timed cells.

Loop Breaking

One of the chief characteristics of the timed cells is that they contain only combinational cells that propagate logic from inputs to outputs. Any feedback from a cell’s transitive fanout back to an input creates a combinational loop that must be broken to reach a steady state. Although the Palladium XP loop breaking algorithm works correctly, the timed cells provided a unique challenge that led to unpredictable results.  Thus, a process was developed to ensure predictable loop breaking behavior. The user input to the process was to provide a property at the loop origin that the netlister recognized and translated to the appropriate loop breaking directives.

Augmented Netlisting

Ease of use and flow automation were two primary considerations in creating a solution that could be deployed more broadly. That made creating a one-step netlisting process a high-value item. The signal point annotation and automatic hierarchy expansion of the “digital timing” parameter helped achieve that goal. The netlister was enriched to identify the key schematic annotations at any point in the hierarchy, including bit and bus signals.

Consistency checking and annotation reporting created a log useful in debugging and evolving the solution.

Wrapper Cell Modeling and Verification

The netlister generates a list of schematic instances at the designated “netlister stop level” for each instance the requires a Verilog model with fine resolution timing. For the design in this paper there were 160 such instances.

The library of timed cells was created; these cells were actually “wrapper” cells comprised of the primitives for timed cell modeling described above. A new verification flow was created that used the behavior of the primitive cells as a reference for the expected behavior of the composed cells. The testing of the composed cells included had the timing width parameter set to 1 to enable direct comparison to the primitive cells. The Cadence Incisive Enterprise Simullator tool was successfully employed to perform assertion-based verification of the composed cells versus the existing primitive cells.

Mapping and Long Paths

Initial experiments showed that inclusion of the fine resolution timed cells into the digital emulation environment would about double the required capacity per run. As previously pointed out, the timed cells having only combinational forward paths creates a loop issue. This fact also had the result of creating some such paths that were more than 5,000 steps of logic. A timed cell optimization process helped to solve this problem. The basic idea was to break the path up by adding flip-flops in strategic locations to reduce combinational path length. The reason that this is important is that the maximum achievable emulation speed is related to combinational path length.

Results

Once the flow was in place, and some realistic test cases were run through it, some further performance tuning opportunities were discovered to additionally reduce runtimes (e.g., Palladium XP tbrun mode was used to gain speed). The reference used for overall speed gains on this solution was versus a purely software-based solution on the highest performance workstation available.

The findings of the performance comparison were startlingly good:

• On Palladium XP, the simulation speed is 50X faster than on Advantest’s fastest workstation

• Software simulation running 25 days can now be run in 12 hours -> realistic runtime enables long-running tests that were not feasible before

• Now have 500 tests that execute once in more than 48 hours

• They can be run much more frequently using randomization and this will increase test coverage dramatically

Steve Carlson

Verification is the top challenge in mixed-signal design. Bringing analog and digital domains together into unified verification planning, simulating, and debugging is a challenging task for rapidly increasing size and complexity of mixed-signal designs. To more completely verify functionality and performance of a mixed-signal SoC and its AMS IP blocks used to build it, verification teams use simulations at transistor, analog behavioral and real-number model (RNM) and RTL levels, and combination of these.

In recent years, RNM and simulation is being adopted for functional verification by many, due to advantages it offers including simpler modeling requirements and much faster simulation speed (compared to a traditional analog behavioral models like Verilog-A or VHDL-AMS). Verilog-AMS with its wreal continue to be popular choice. Standardization of real number extensions in SystemVerilog (SV) made SV-RNM an even more attractive choice for MS SoC verification.

Verilog-AMS/wreal is scalar real type. SV-RNM offers a powerful ability to define complex data types, providing a user-defined structure (record) to describe the net value. In a typical design, most analog nodes can be modeled using a single value for passing a voltage (or current) from one module to another. The ability to pass multiple values over a net can be very powerful when, for example, the impedance load impact on an analog signal needs to be modeled. Here is an example of a user-defined net (UDN) structure that holds voltage, current, and resistance values:

When there are multiple drives on a single net, the simulator will need a resolution function to determine the final net value. When the net is just defined as a single real value, common resolution functions such as min, max, average, and sum are built into the simulator.  But definition of more complex structures for the net also requires the user to provide appropriate resolution functions for them. Here is an example of a net with three drivers modeled using the above defined structural elements (a voltage source with series resistance, a resistive load, and a current source):

To properly solve for the resulting output voltage, the resolution function for this net needs to perform Norton conversion of the elements, sum their currents and conductances, and then calculate the resolved output voltage as the sum of currents divided by sum of conductances.

With some basic understanding of circuit theory, engineers can use SV-RNM UDN capability to model electrical behavior of many different circuits. While it is primarily defined to describe source/load impedance interactions, its use can be extended to include systems including capacitors, switching circuits, RC interconnect, charge pumps, power regulators, and others. Although this approach extends the scope of functional verification, it is not a replacement for transistor-level simulation when accuracy, performance verification, or silicon correlation are required:  It simply provides an efficient solution for discretely modeling small analog networks (one to several nodes).  Mixed-signal simulation with an analog solver is still the best solution when large nonlinear networks must be evaluated.

Cadence provides a tutorial on EEnet usage as well as the package (EEnet.pkg) with UDN definitions and resolution functions and modeling examples. To learn more, please login to your Cadence account to access the tutorial.

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