1 Peruvian Nuevo Sol = 0.8687 Lithuanian Lita

1 Dominican Peso = 0.0536 Lithuanian Lita

Baldwin City, Kansas - The Haskell Indian Nations University men's track and field teams competed at the Baker Relays on Saturday.

1 Papua New Guinean Kina = 0.8608 Lithuanian Lita

1 Brunei Dollar = 2.0893 Lithuanian Lita

Differentiating good IP from mediocre or bad IP is getting more difficult, in part because it depends upon how and where it is used and in part, because even the best IP may work better in one system than another—even in chips developed by the same vendor.  

So, how do you measure IP quality and why it is so complicated?

The answer depends on who is asking. Most of the time, the definition of IP quality depends on your vantage point.  If you are an R&D manager, IP quality means something. If you are a global supply manager, IP quality means something else. If you are an SoC start-up, your measure of quality is quite different from that of an established fabless company. If you are designing IP in-house, then your considerations are very different than being a commercial IP vendor. If you are designing an automotive SoC, then we are in a totally different category. How about as an IP vendor? How do you articulate IP quality metrics to your customers?

This varies greatly by the type of IP, as well. When it comes to interface (hard) IP and controllers, if you are an R&D manager, your goal is to design IP that meets the IP specifications and PPA (power, performance, and area) targets. You need to validate your design via silicon test chips. This applies to all hard PHYs, which must be mapped to a particular foundry process. For controllers that are in RTL form—we called these soft IP—you have to synthesize them into a particular target library in a particular foundry process in order to realize them in a physical form suitable for SoC integration. Of course, your design will need to go through a series of design validation steps via simulation, design verification and passing the necessary DRC checks, etc. In addition, you want to see the test silicon in various process corners to ensure the IP is robust and will perform well under normal process variations in the production wafers.

For someone in IP procurement, the measure of quality will be based on the maturity of the IP. This involves the number of designs that have been taped out using this IP and the history of bug reports and subsequent fixes. You will be looking for quality of the documentation and the technical deliverables. You will also benchmark the supplier’s standard operating procedures for bug reporting and technical support, as well as meeting delivery performance in prior programs. This is in addition to the technical teams doing their technical diligence.

An in-house team that is likely to design IP for a particular SoC project will be using an established design flow and will have legacy knowledge of last generation’s IP. They may be required to design the IP with some reusability in mind for future programs. However, such reusability requirements will not need to be as stringent and as broad as those of commercial IP vendors because there are likely to be established metrics and procedures in place to follow as part of the design team’s standard operating procedures. Many times, new development based on a prior design that has been proven in use will be started, given this stable starting point. All of these criteria help the team achieve a quality outcome more easily.

Then, if designing for an automotive SoC, additional heavy lifting is required.  Aside from ensuring that the IP meets the specifications of the protocol standards and passes the compliance testing, you also must pay attention to meeting functional safety requirements. This means adherence to ISO 26262 requirements and subsequently achieving ASIL certification. Oftentimes, even for IP, you must perform some AEC-Q100-related tests that are relevant to IP, such as ESD, LU, and HTOL.

To read more, please visit: https://semiengineering.com/why-ip-quality-is-so-difficult-to-determine/

Is there a better approach to varying the coefficients of a digital IIR over time to adjust the values of its poles and zeros than just recalculating the whole thing every time it changes? For example, lots of synth programs can apply an LFO to the cutoff frequency of a low/high pass filter. I can do some polynomial multiplication to get the coefficients for an IIR filter given its poles and zeros, but am wondering if there is a better way to adjust them over time than simply doing all the calculations over again for new poles/zeros. Particularly, I'm curious if there is a method that will more or less work for an arbitrary number of poles and zeros. You could use a filter implementation (state space) that directly uses the pole/zero values instead of a polynomial walmartone. That might be computationally more expensive, though (as you are taking a trip through the domain of complex numbers even though your inputs and output are real), and possibly numerically iffy.As far as I am aware, modifying filter behavior while introducing as few artefacts as possible is still an area of research. You might get away with just adjusting the filter coefficients if you do it slowly, but this does not mean this is the best method.In an audio application, I assume they do not switch filter coefficients abruptly, but instead do a cross-fade between the (settled) first filter and the (mostly or completely settled) target filter to avoid audible artefacts.

Hi,

I was wondering if it is possible to save the coordinates of each stripe and row of the power grid 

and if it is possible to find out the effective resistance between two given points using Voltus

My goal is to built a resistance model of the power grid

Thanks

I have been using Voltus to do IR drop analysis but I got caught on one signal. It is negative. When I use:

set_pg_nets -net negsupply -voltage -5 -threshold -4.5 -package_net_name NEGSUP -force

Voltus dies with a backtrace. Looking at the beginning of the trace you see it suggests that the problem is it set maximum to -5 and minimum to 0. Is there another way to express a negative voltage supply for IR drop analysis?

Dear all,

I am using Conformal Constraint Designer (Version 17.1) to analyse a SystemVerilog based design.

While performing default HDL checks it finds  some violations (issues) in RTL and complains (warnings, etc) about RTL checks and others.

My questions:

Is there any directive which I can add to RTL (system Verilog) so that particular line of code or signal is ignored or not checked for HDL or RTL checks.

I can set ignore rules in rule manager (gui) but it does not seems effective if code line number changes or new signals are introduced.

What is the best way to customize default_hdl_rules ?

I will be grateful for your guidance.

Thanks for your time.

Hi,

I am trying to use "sed -e 's " from SKILL code to edit unix file "FileA", to replace 3 words in the 2nd line.

How to run below multiple commands using  ipcBeginProcess, Should I use ipcWait or ipcCloseProcess ?

Using && to combine , will that work as I have to work serially on each command. ?

With below code only the first command gets executed. Please advise.

FileA="/user/tmp/text1.txt"

sprintf(Command1 "sed -e '2s/%s/%s/g' %s > %s" comment1 get(form concat("dComment" RDWn))->value FileA FileA)
cid = ipcBeginProcess(Command1)


sprintf(Command2 "sed -e '2s/%s/%s/g' %s > %s"  Time getCurrentTime() FileA FileA)
cid1 = ipcBeginProcess(Command2)


sprintf(Command3 "sed -e '2s/%s/%s/g' %s > %s"  comment2 get(form concat("Duser" RDWn))->value FileA FileA)
cid2 = ipcBeginProcess(Command3)

Thanks,

Ajay

Hi,

I want to convert ircx file(which is from TSMC,inclued EM Information) to ict or emDataFile for Voltus-fi.

I tried many way, but I can not make it. Can anyone give me some advice?

and I  do not installed QRC.

below is some tools installed my server. 

IC617-64b.500.21 is used.

When I place a pcell and do not change the W parameter (default is used) the value is not saved in the OA cell property.

When I change the default value of the super master now, the old pcell will get the new default value automatically because there is nothing saved inside the OA cell for this parameter.

Do you have any Idea, that how we can save the default values in the OA cell properties so that this value doesn't get updated if the default values are updated in the new PDKs

Hi there,

I'm running a transient simulation, and I want to get all instances with model implementation hisim_hv because after that I want to process the data and to adjust some parameters for this kind of devices before dumping the values.

What is the easiest/fastest way to get those instances in skill/ocean?

What I did until now: 

- save the final OP of the simulation and then in skill

openResults()
selectResults('tranOp)
report(?type "hisim_hv" ?param "vgs")

Output seems to be promising, and looks like I can redirect it to a file and after that I have to parse the file.

Is there other simple way? I mean to not save data to file and to parse it.

Eventually having an instance name, is it possible to get the model implementation (hsim_hv, bsim4, etc..)? 

Best Regards,

Marcel

Vegas, here we come. All of us fun EDA engineers at once. Be prepared, next week’s Design Automation Conference will be busy! The trends I had outlined after last DAC in 2018—system design, cloud, and machine learning—have...(read more)

Emulators are great. They vastly speed up verification to the point where it’s hard to imagine life without them; as designs grow in complexity, simple simulation can’t keep up for the biggest designs. The extra oomph from emulation is almost a necessity for the top percentages of design sizes. However, many users of Palladium aren’t efficiently using their unit’s processing power, and as a result they’re missing out on the full speed-up potential that Palladium can provide.

Altair’s HERO is here for you. With its help, your Palladium unit can be even more amazing for your productivity than before.

HERO (that’s Hardware Emulator Resource Optimizer) adds emulator support to Altair’s Accelerator. You already know and love Altair’s scheduling tools; so why not make them do more for you, so you can be one of those people who are making the most out of their Palladium system?

Emulators are kind of like big computers, but it’s a lot harder to manage leftover resources on an emulator than it is on, say, a CPU. A scheduler like HERO neatly sidesteps this problem by more intelligently using the resources available to ensure that there’s a minimal patchwork of leftover resources to begin with.

HERO supports past generations of Palladium as well, so if you’re still using an older version, you can still take advantage of the upgrades HERO provides. There’s a wide variety of features HERO has that make your emulator easier to use. HERO separates a job into a “select” section and a “run” section: the “select” part makes a last-minute decision on which domains or boards to use, while the “run” part is the actual job. This makes it easier to ensure that your Palladium emulator is being used as efficiently as possible. Jobs are placed using “shapes”, which are a set of job types; these can be selected from a list of pre-defined ones by the user. Shapes can have special constraints if those are needed.

A new reservation system also helps HERO organize Palladium’s processing power better. HERO offers both “hard” reservations and “soft” reservations. A hard reservation locks other users out of reserving any part of the emulator at all, while a soft reservation allows a user to reserve a part of the emulator for a later use. Think of it like this: a soft reservation is like grabbing a ticket from the deli counter, while a hard reservation stops you from ever entering the market.

When using HERO, you can manage your entire verification workload. You’ll find that your utilization of your emulator vastly increases—it’s been reported that some users using only 30% of the capabilities of their Palladium unit(s) saw a massive increase to over 90% once they made the switch to HERO.

If you’re ready to take your Palladium productivity to the next level, Altair has a HERO for you.

To see the full presentation given by Andrea Casotto in the Cadence Theater at DAC 2019, check here.

I noticed some very interesting news last week, widely reported in the technical press, and you can find the source press release here. In a nutshell, the Embedded Microprocessor Benchmark Consortium (EEMBC) has formed a group to look at benchmarks for ultra low power microcontrollers. Initially chaired by Horst Diewald, chief architect of MSP430^TM microcontrollers at Texas Instruments, the group's line-up is an impressive "who's who" of the microcontroller space, including Analog Devices, ARM, Atmel, Cypress, Energy Micro, Freescale, Fujitsu, Microchip, Renesas, Silicon Labs, STMicro, and TI.

As the press release explains, unlike usual processor benchmark suites which focus on performance, the ULP benchmark will focus on measuring the energy consumed by microcontrollers running various computational workloads over an extended time period. The benchmarking methodology will allow the microcontrollers to enter into their idle or sleep modes during the majority of time when they are not executing code, thereby simulating a real-world environment where products must support battery life measured in months, years, and even decades.

Processor performance benchmarks seem to be as widely criticized as EPA fuel consumption figures for cars - and the criticism is somewhat related. There is a suspicion that manufacturers can tune the performance for better test results, rather than better real-world performance. On the face of it, the task to produce meaningful ultra low power benchmarks seems even more fraught with difficulties. For a start, there is a vast range of possible energy profiles - different ways that computing is spread over time - and a plethora of low power design techniques available to optimize the system for the set of profiles that particular embedded system is likely to experience. Furthermore, you could argue that, compared with performance in a computer system, energy consumption in an ultra low power embedded system has less to do with the controller itself and more to do with other parts of the system like the memories and mixed-signal real-world interfaces.

EEMBC cites that common methods to gauge energy efficiency are lacking in growth applications such as portable medical devices, security systems, building automation, smart metering, and also applications using energy harvesting devices. At Cadence, we are seeing huge growth in these areas which, along with intelligence being introduced into all kinds of previously "dumb" appliances, is becoming known as the "Internet of Things." Despite the difficulties, with which the parties involved are all deeply familiar, I applaud this initiative. While it may be difficult to get to apples-to-apples comparisons for energy consumption in these applications, most of the time today we don't even know where the grocery store is. If the EEMBC effort at least gets us to the produce department, we're going to be better off.

Pete Hardee 

Hello All,

May I know if there is a way to breakup a selected clinesegment into a few clinesegments by just using SKILL code

Thanks All

Hi,

I'm doing fault injection with ncsim and got stuck at the following (and not so useful) message: "ncsim: *E,FLTIGF: [FLT] Failed to inject fault at circuit_tb.U0.n2174." I already tried with other NETs, with SET, SA0, SA1, always the same error occurs.

My scripts so far, considering I already compiled the Verilog testbench and also the gates from the technology library (gate-level simulation):

#this runs ok

ncelab -work worklib -cdslib circuit/trunk/backend/synthesis/work/cds.lib -logfile ncelab.log -errormax 15 -access +wc -status -timescale 1ps/1ps worklib.circuit_tb -fault_file circuit/trunk/backend/synthesis/scripts/fi.list

#this runs ok
ncsim -fault_good_run -fault_tw 1ns:4ns -fault_work fault_db -fault_overwrite worklib.circuit_tb:module -input ../scripts/fs_strobe.tcl -exit

#this runs NOT OK
ncsim -fault_sim_run -fault_work fault_db worklib.circuit_tb:module -input ../scripts/injection.tcl -exit

After the above command I get: "ncsim: *E,FLTIGF: [FLT] Failed to inject fault at circuit_tb.U0.n2174."

Here are the files called from the commands above.

fi.list:

fault_target circuit_tb.U0.n2174 -type SET+SA1+SA0

fs_strobe.tcl:

fs_strobe circuit_tb.WRITE_OUT circuit_tb.PC_OUT[0]

injection.tcl:

fault -stop_severity 3 -inject -time 2ns -type sa1 circuit_tb.U0.n2174

I already checked the NETs with simvision, so their paths are correct.

Any ideas?

PS: I know about Xcellium, however, I don't have it yet.

In the Allegro back-end layout products like Allegro Package Designer Plus, it would be reasonable to assume that the most often used command is none other than “show element” (shortcut key F4). This command, runnable at nearly any t...(read more)

Variants seem to be defined as present or not present.

Is there a variant that can assign different parts to the same reference designator? i.e.  R17 can be either 0 ohm 0805 jumper or 12k ohms 0805 resistor.

The simplest way I can think of is to use two parts with the same footprint and overlay them.

Is there a more functional way of doing this?  So that the variant would put the correct part in the BOM and the parts would of course have the same identical footprint.

Hello All,

I'm currently using OrCAD PCB Designer Professional w/ PSpice (version 16.6-2015).  In the 'Design Object Find Filter' side bar, all options are grayed out and unselectable.  I did attempt to 'Reset UI to Cadence Default' without any luck.  A colleague has no issues with the identical file on his computer.  Any guidance would be much appreciated.  Thanks!

George

Hello All,

I have a situation where i want to implement 8 instance of some particular reg_file which all have many reg_def and reg_fld.

For example :
I have 8 instance of one DUT module (TEST0, TEST1,TEST2... TEST8), since its all are the instance so all the instance will have the sets of registers.. so to implement reg for one instance i can write code like..

extend vr_ad_reg_file_kind : [TEST0];
extend TEST0 vr_ad_reg_file {
keep size == 256;
};
reg_def EX_REG_TX_DATA TEST0 8’h00 {
// name : type : mask : reset value
reg_fld data : uint(bits:8) : RW : 0;
};

But now the issue is inside 1 instance i have around 256 registers, and i need to implement for all the 8 instance.... so can anyone suggest me how we can make instance for vr_ad_reg_file, otherwise i have to write same code for all the 8 instance.

Thanks

Hi all,

I am using ADE assembler.

I ran transient simulation and swept the input frequency (Fin) of the circuit. And I use Spectrum Measurement to return a value of the fundamental tone magnitude (Sig_fund) for each sweep point. 

Previously, I use "plot across design points" to plot both "Fin" and "Sig_fund", and then use "Y vs Y" to get a waveform of Sig_fund vs Fin. Measure the 1dB Bandwidth with markers. 

Can I realized above measurement with an expression in "output setup" ? And how?

I know to set the "Eval type" to "sweep" to process the data across sweep points. But here, it has to return an interpolated value from "Fin" with a criteria "(value(calcVal("Sig_fund"  0) - 1)". I am not sure whether it can be done in ADE assembler.

Thanks and regards,

Yutao

Hi,

I want to convert ircx file(which from TSMC) to ict or emDataFile for Voltus-fi.

I tried many way, but I can not make it.

and I  do not installed QRC.

below is some tools installed my server. 

IC617-64b.500.21 is used.

Hello,

I am using ultrasim Version 18.1.0.314.isr5  64bit 03/26/2019 06:33 (csvcm20c-2).

When I run my netlist, ultrasim is blocked in the first DC stage and takes forever. Then it will fail or never progress. I am using a 22nm BSIMBULK model. I tried to tune different accuracy and convergence aids options but noting works.

 When I run the same netlist with spectre it works fine with no problem.

Also, If I use another model (not BULKSIM), ultrasim will work and converge with no problem.

My first feeling is that ultrasim has a problem with using BSIMBULK model.

Could you please advice,

Thank you,

Kotb

જાન્યુઆરીથી માર્ચ 2020 દરમિયાન કંપનીની નેટ પ્રોફિટ (Jio Net Profit)લગભગ ત્રણ ગણી વધીને 2,331 કરોડ રુપિયા પહોંચી ગઇ, રિલાયન્સ જિયો 38.75 કરોડ સબ્સક્રાઇબર્સની સાથે દુનિયાની સૌથી મોટી ટેલિકોમ કંપની છે

visit News18 Urdu for latest news, breaking news, news headlines and updates from Sultanpur on politics, sports, entertainment, cricket, crime and more.

UltraVNC Launcher version 1.2.4.0 Password denial of service proof of concept exploit.

UltraVNC Viewer version 1.2.4.0 VNCServer denial of service proof of concept exploit.

UltraVNC Launcher version 1.2.4.0 RepeaterHost denial of service proof of concept exploit.

•Dassault Systèmes becomes the first and only software provider today to be recognized as Groupe PSA’s preferred digital partner •Dassault Systèmes and Groupe PSA engage in long-term strategy with the intent to further deploy the 3DEXPERIENCE platform •New level of partnership will enable Groupe PSA to improve efficiency and innovation in challenging marketplace

•An in silico clinical trial is underway with the 3DEXPERIENCE platform to evaluate the Living Heart simulated 3D heart for transforming how new devices can be tested •Five-year extension of their collaborative research agreement aims to spur medical device innovation by enabling innovative, new product designs •Both Dassault Systèmes and the FDA recognize the transformative impact of modeling and simulation on public health and patient safety

•Dassault Aviation will rely on six Dassault Systèmes industry solution experiences to integrate business processes, improve performance and reduce costs •Deployment marks next step in Dassault Aviation’s digital transformation plan through a platform approach, launched in 2018 •Dassault Systèmes’ 3DEXPERIENCE platform will power artificial intelligence-based application for intelligent enterprise services

•Dassault Systèmes collaborated with SATS, Asia’s leading food solutions and gateway services provider, to boost operational efficiency, minimize food waste •Growth in airline passenger travel underscores need for sustainable excellence in aerospace industry-related commercial services •Digital twin experience with the 3DEXPERIENCE platform bridges the gap between the virtual and real for in-flight catering production

VÉLIZY-VILLACOUBLAY, France and NEW YORK — August 19, 2019 – Dassault Systèmes SE (Dassault Systèmes) (Euronext Paris: #13065, DSY. PA) and Medidata Solutions, Inc. ("Medidata") (NASDAQ: MDSO) announced that Medidata stockholders have approved on August 16, 2019 the proposed acquisition of Medidata by Dassault Systèmes. At a special meeting of Medidata stockholders held on August 16, 2019, 78% of Medidata’s total outstanding common stock voted in favor of the proposed acquisition and...

PARIS, France – August 27, 2019 – Dassault Systèmes, the 3DEXPERIENCE Company, world leader in 3D design software, 3D Digital Mock Up and Product Lifecycle Management (PLM) solutions, today announces that it has received its first long-term issuer credit rating. S&P Global Ratings has assigned to Dassault Systèmes a rating of ‘A-‘with a stable outlook and “Strong” business risk profile. The “Strong” business risk profile notably reflects S&P Global Ratings’ view of the Group’s high...

PARIS, France – September 10th, 2019 – Dassault Systèmes, the 3DEXPERIENCE Company, world leader in 3D design software, 3D Digital Mock Up and Product Lifecycle Management (PLM) solutions, today announces that it has successfully priced its inaugural senior unsecured Eurobonds in four tranches for a total of €3.65 billion. This bond issue has the following maturities: 3 years and 5 years, which carry zero coupons and 7-year and 10-year tranches priced at 0.19% and 0.44% respectively. The...

•Annual event in Shanghai gathers global decision-makers to discuss digital trends, insights and best practices for sustainable manufacturing in the Industry Renaissance •Speakers include thought leaders from ABB, Accenture, China Center for Information Industry Development, FAW Group Corporation, Huawei, IDC, SATS •Interactive workshops featuring the 3DEXPERIENCE platform highlight the transformative role of virtual worlds on the creation of new customer experiences